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1 Ergebnisse
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Ion-beam exposure on PAM surface according to molecular con..:
Lee, Dong Wook
;
Kim, Dong Hyun
;
Oh, Jin Young
...
Journal of Materials Science: Materials in Electronics. 34 (2023) 13 - p. , 2023
Link:
https://doi.org/10.1007/s10854-023-10523-6
RT Journal T1 <Title>Ion-beam exposure on PAM surface according to molecular concentration for application to liquid-crystal device</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-023-10523-6&Exemplar=1&LAN=DE A1 Lee, Dong Wook A1 Kim, Dong Hyun A1 Oh, Jin Young A1 Won, Jonghoon A1 Yang, Da Bin A1 Jeong, Hae-Chang A1 Seo, Dae-Shik PB Springer Science and Business Media LLC YR 2023 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 34 IS 13 LK http://dx.doi.org/https://doi.org/10.1007/s10854-023-10523-6 DO https://doi.org/10.1007/s10854-023-10523-6 SF ELIB - SuUB Bremen
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