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Precision assessment of carrier concentration in semiconduc..:
Zubkov, Vasily
;
Yakovlev, George
;
Solomnikova, Anna
.
Journal of Materials Science: Materials in Electronics. 35 (2024) 17 - p. , 2024
Link:
https://doi.org/10.1007/s10854-024-12771-6
RT Journal T1 <Title>Precision assessment of carrier concentration in semiconductors with negative electron affinity</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-024-12771-6&Exemplar=1&LAN=DE A1 Zubkov, Vasily A1 Yakovlev, George A1 Solomnikova, Anna A1 Orlova, Tatiana PB Springer Science and Business Media LLC YR 2024 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 35 IS 17 LK http://dx.doi.org/https://doi.org/10.1007/s10854-024-12771-6 DO https://doi.org/10.1007/s10854-024-12771-6 SF ELIB - SuUB Bremen
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