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1 Ergebnisse
1
Mapping TES Temperature Sensitivity and Current Sensitivity..:
Zhou, Y.
;
Ambarish, C. V.
;
Gruenke, R.
...
Journal of Low Temperature Physics. 193 (2018) 3-4 - p. 321-327 , 2018
Link:
https://doi.org/10.1007/s10909-018-1970-8
RT Journal T1 <Title>Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10909-018-1970-8&Exemplar=1&LAN=DE A1 Zhou, Y. A1 Ambarish, C. V. A1 Gruenke, R. A1 Jaeckel, F. T. A1 Kripps, K. L. A1 McCammon, D. A1 Morgan, K. M. A1 Wulf, D. A1 Zhang, S. A1 Adams, J. S. A1 Bandler, S. R. A1 Chervenak, J. A. A1 Datesman, A. M. A1 Eckart, M. E. A1 Ewin, A. J. A1 Finkbeiner, F. M. A1 Kelley, R. L. A1 Kilbourne, C. A. A1 Miniussi, A. R. A1 Porter, F. S. A1 Sadleir, J. E. A1 Sakai, K. A1 Smith, S. J. A1 Wakeham, N. A. A1 Wassell, E. J. A1 Yoon, W. PB Springer Science and Business Media LLC YR 2018 SN 0022-2291 SN 1573-7357 JF Journal of Low Temperature Physics VO 193 IS 3-4 SP 321 OP 327 LK http://dx.doi.org/https://doi.org/10.1007/s10909-018-1970-8 DO https://doi.org/10.1007/s10909-018-1970-8 SF ELIB - SuUB Bremen
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