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Application of Mie theory and fractal models to determine t..:
Țălu, Ștefan
;
Yadav, Ram Pratap
;
Mittal, Ashok Kumar
...
Optical and Quantum Electronics. 49 (2017) 7 - p. , 2017
Link:
https://doi.org/10.1007/s11082-017-1079-3
RT Journal T1
Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s11082-017-1079-3&Exemplar=1&LAN=DE A1 Țălu, Ștefan A1 Yadav, Ram Pratap A1 Mittal, Ashok Kumar A1 Achour, Amine A1 Luna, Carlos A1 Mardani, Mohsen A1 Solaymani, Shahram A1 Arman, Ali A1 Hafezi, Fatemeh A1 Ahmadpourian, Azin A1 Naderi, Sirvan A1 Saghi, Khalil A1 Méndez, Alia A1 Trejo, Gabriel PB Springer Science and Business Media LLC YR 2017 SN 0306-8919 SN 1572-817X JF Optical and Quantum Electronics VO 49 IS 7 LK http://dx.doi.org/https://doi.org/10.1007/s11082-017-1079-3 DO https://doi.org/10.1007/s11082-017-1079-3 SF ELIB - SuUB Bremen
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