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Dislocation Analysis in (112)B HgCdTe/CdTe/Si:

Benson, J. D. ; Farrell, S. ; Brill, G....
Journal of Electronic Materials.  40 (2011)  8 - p. 1847-1853 , 2011
Link: https://doi.org/10.1007/s11664-011-1670-5