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1 Ergebnisse
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Microstructural Characterization of HgCdSe Grown by Molecul..:
Zhao, W. F.
;
Brill, G.
;
Chen, Y.
.
Journal of Electronic Materials. 41 (2012) 10 - p. 2852-2856 , 2012
Link:
https://doi.org/10.1007/s11664-012-2069-7
RT Journal T1 <Title>Microstructural Characterization of HgCdSe Grown by Molecular Beam Epitaxy on ZnTe/Si(112) and GaSb(112) Substrates</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s11664-012-2069-7&Exemplar=1&LAN=DE A1 Zhao, W. F. A1 Brill, G. A1 Chen, Y. A1 Smith, David J. PB Springer Science and Business Media LLC YR 2012 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 41 IS 10 SP 2852 OP 2856 LK http://dx.doi.org/https://doi.org/10.1007/s11664-012-2069-7 DO https://doi.org/10.1007/s11664-012-2069-7 SF ELIB - SuUB Bremen
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