I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Multiwavelength Micro-Raman Characterization of Epitaxial S..:
Chang, Chun-Wei
;
Hong, Min-Hao
;
Tsai, Ming-Shan
...
Journal of Electronic Materials. 41 (2012) 11 - p. 3125-3129 , 2012
Link:
https://doi.org/10.1007/s11664-012-2207-2
RT Journal T1
Multiwavelength Micro-Raman Characterization of Epitaxial Si1−x Ge x Layers on Si(100) and In-Line Process Monitoring Applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s11664-012-2207-2&Exemplar=1&LAN=DE A1 Chang, Chun-Wei A1 Hong, Min-Hao A1 Tsai, Ming-Shan A1 Lee, Kuan-Ching A1 Lee, Wei-Fan A1 Chuang, Yen A1 Fan, Yu-Ta A1 Ueda, Takeshi A1 Ishigaki, Toshikazu A1 Kang, Kitaek A1 Yoo, Woo Sik PB Springer Science and Business Media LLC YR 2012 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 41 IS 11 SP 3125 OP 3129 LK http://dx.doi.org/https://doi.org/10.1007/s11664-012-2207-2 DO https://doi.org/10.1007/s11664-012-2207-2 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)