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Analysis of Etched CdZnTe Substrates:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 45 (2016) 9 - p. 4502-4510 , 2016
Link:
https://doi.org/10.1007/s11664-016-4642-y
RT Journal T1 <Title>Analysis of Etched CdZnTe Substrates</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s11664-016-4642-y&Exemplar=1&LAN=DE A1 Benson, J. D. A1 Bubulac, L. O. A1 Jaime-Vasquez, M. A1 Lennon, C. M. A1 Arias, J. M. A1 Smith, P. J. A1 Jacobs, R. N. A1 Markunas, J. K. A1 Almeida, L. A. A1 Stoltz, A. A1 Wijewarnasuriya, P. S. A1 Peterson, J. A1 Reddy, M. A1 Jones, K. A1 Johnson, S. M. A1 Lofgreen, D. D. PB Springer Science and Business Media LLC YR 2016 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 45 IS 9 SP 4502 OP 4510 LK http://dx.doi.org/https://doi.org/10.1007/s11664-016-4642-y DO https://doi.org/10.1007/s11664-016-4642-y SF ELIB - SuUB Bremen
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