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Characterization of (211) and (100) CdTe Layers Grown on Si..:

Yasuda, K. ; Niraula, M. ; Kojima, M....
Journal of Electronic Materials.  46 (2017)  11 - p. 6704-6708 , 2017
Link: https://doi.org/10.1007/s11664-017-5703-6