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Thickness Dependence of Optoelectronic Properties of Molybd..:
Achouri, Mohamed Malik
;
Tab, Abdelkader
;
Abderrahmane, Abdelkader
...
Journal of Electronic Materials. 48 (2019) 11 - p. 7025-7030 , 2019
Link:
https://doi.org/10.1007/s11664-019-07506-x
RT Journal T1
Thickness Dependence of Optoelectronic Properties of Molybdenum Diselenide-Based Nanodevices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s11664-019-07506-x&Exemplar=1&LAN=DE A1 Achouri, Mohamed Malik A1 Tab, Abdelkader A1 Abderrahmane, Abdelkader A1 Lee, Dong Jin A1 Oh, Jong-Min A1 Kim, Nam-Hoon A1 Ko, Pil Ju PB Springer Science and Business Media LLC YR 2019 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 48 IS 11 SP 7025 OP 7030 LK http://dx.doi.org/https://doi.org/10.1007/s11664-019-07506-x DO https://doi.org/10.1007/s11664-019-07506-x SF ELIB - SuUB Bremen
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