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High resolution strain mapping of a single axially heterost..:
Hammarberg, Susanna
;
Dagytė, Vilgailė
;
Chayanun, Lert
...
Nano Research. 13 (2020) 9 - p. 2460-2468 , 2020
Link:
https://doi.org/10.1007/s12274-020-2878-6
RT Journal T1
High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s12274-020-2878-6&Exemplar=1&LAN=DE A1 Hammarberg, Susanna A1 Dagytė, Vilgailė A1 Chayanun, Lert A1 Hill, Megan O. A1 Wyke, Alexander A1 Björling, Alexander A1 Johansson, Ulf A1 Kalbfleisch, Sebastian A1 Heurlin, Magnus A1 Lauhon, Lincoln J. A1 Borgström, Magnus T. A1 Wallentin, Jesper PB Springer Science and Business Media LLC YR 2020 SN 1998-0124 SN 1998-0000 JF Nano Research VO 13 IS 9 SP 2460 OP 2468 LK http://dx.doi.org/https://doi.org/10.1007/s12274-020-2878-6 DO https://doi.org/10.1007/s12274-020-2878-6 SF ELIB - SuUB Bremen
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