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A stitching algorithm for measuring large areas using scann..:
Hong, Won-Pyo
;
Lee, Seok-Woo
;
Choi, Hon-Zong
International Journal of Precision Engineering and Manufacturing. 14 (2012) 1 - p. 147-151 , 2012
Link:
https://doi.org/10.1007/s12541-013-0020-3
RT Journal T1 <Title>A stitching algorithm for measuring large areas using scanning electron microscopes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s12541-013-0020-3&Exemplar=1&LAN=DE A1 Hong, Won-Pyo A1 Lee, Seok-Woo A1 Choi, Hon-Zong PB Springer Science and Business Media LLC YR 2012 SN 2234-7593 SN 2005-4602 JF International Journal of Precision Engineering and Manufacturing VO 14 IS 1 SP 147 OP 151 LK http://dx.doi.org/https://doi.org/10.1007/s12541-013-0020-3 DO https://doi.org/10.1007/s12541-013-0020-3 SF ELIB - SuUB Bremen
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