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1 Ergebnisse
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Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset pro..:
Gao, Shuai
;
Li, Xin-Yu
;
Zhao, Shi-Wei
...
Nuclear Science and Techniques. 33 (2022) 12 - p. , 2022
Link:
https://doi.org/10.1007/s41365-022-01142-7
RT Journal T1
Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s41365-022-01142-7&Exemplar=1&LAN=DE A1 Gao, Shuai A1 Li, Xin-Yu A1 Zhao, Shi-Wei A1 He, Ze A1 Ye, Bing A1 Cai, Li A1 Sun, You-Mei A1 Xiao, Guo-Qing A1 Cai, Chang A1 Liu, Jie PB Springer Science and Business Media LLC YR 2022 SN 1001-8042 SN 2210-3147 JF Nuclear Science and Techniques VO 33 IS 12 LK http://dx.doi.org/https://doi.org/10.1007/s41365-022-01142-7 DO https://doi.org/10.1007/s41365-022-01142-7 SF ELIB - SuUB Bremen
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