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A Novel Approach to Analyze the Resistance of the RRAM Base..:
Vijay, H. M.
;
Ramakrishnan, V. N.
Transactions on Electrical and Electronic Materials. 23 (2021) 5 - p. 476-482 , 2021
Link:
https://doi.org/10.1007/s42341-021-00374-5
RT Journal T1 <Title>A Novel Approach to Analyze the Resistance of the RRAM Based on the Conductive Nano Filament Length and Width Variation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s42341-021-00374-5&Exemplar=1&LAN=DE A1 Vijay, H. M. A1 Ramakrishnan, V. N. PB Springer Science and Business Media LLC YR 2021 SN 1229-7607 SN 2092-7592 JF Transactions on Electrical and Electronic Materials VO 23 IS 5 SP 476 OP 482 LK http://dx.doi.org/https://doi.org/10.1007/s42341-021-00374-5 DO https://doi.org/10.1007/s42341-021-00374-5 SF ELIB - SuUB Bremen
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