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1 Ergebnisse
1
Deep Learning-Based Integrated Circuit Surface Defect Detec..:
Wang, Xiaobin
;
Gao, Shuang
;
Guo, Jianlan
...
International Journal of Computational Intelligence Systems. 17 (2024) 1 - p. , 2024
Link:
https://doi.org/10.1007/s44196-024-00423-w
RT Journal T1 <Title>Deep Learning-Based Integrated Circuit Surface Defect Detection: Addressing Information Density Imbalance for Industrial Application</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s44196-024-00423-w&Exemplar=1&LAN=DE A1 Wang, Xiaobin A1 Gao, Shuang A1 Guo, Jianlan A1 Wang, Chu A1 Xiong, Liping A1 Zou, Yuntao PB Springer Science and Business Media LLC YR 2024 SN 1875-6883 JF International Journal of Computational Intelligence Systems VO 17 IS 1 LK http://dx.doi.org/https://doi.org/10.1007/s44196-024-00423-w DO https://doi.org/10.1007/s44196-024-00423-w SF ELIB - SuUB Bremen
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