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Microminiaturization:
Granville, J.W
Microelectronics Reliability. 1 (1962) 3 - p. 269 , 1962
Link:
https://doi.org/10.1016/0026-2714(62)90030-6
RT Journal T1 <Title>Microminiaturization</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(62)90030-6&Exemplar=1&LAN=DE A1 Granville, J.W PB Elsevier BV YR 1962 SN 0026-2714 JF Microelectronics Reliability VO 1 IS 3 SP 269 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(62)90030-6 DO https://doi.org/10.1016/0026-2714(62)90030-6 SF ELIB - SuUB Bremen
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