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Letter to the editor:
Karp, Martin A.
Microelectronics Reliability. 4 (1965) 2 - p. 234 , 1965
Link:
https://doi.org/10.1016/0026-2714(65)90083-1
RT Journal T1 <Title>Letter to the editor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(65)90083-1&Exemplar=1&LAN=DE A1 Karp, Martin A. PB Elsevier BV YR 1965 SN 0026-2714 JF Microelectronics Reliability VO 4 IS 2 SP 234 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(65)90083-1 DO https://doi.org/10.1016/0026-2714(65)90083-1 SF ELIB - SuUB Bremen
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