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Prediction and engineering assessment in early design:
Cole, W.P.
Microelectronics Reliability. 5 (1966) 2 - p. 129-144 , 1966
Link:
https://doi.org/10.1016/0026-2714(66)90087-4
RT Journal T1 <Title>Prediction and engineering assessment in early design</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(66)90087-4&Exemplar=1&LAN=DE A1 Cole, W.P. PB Elsevier BV YR 1966 SN 0026-2714 JF Microelectronics Reliability VO 5 IS 2 SP 129 OP 144 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(66)90087-4 DO https://doi.org/10.1016/0026-2714(66)90087-4 SF ELIB - SuUB Bremen
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