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Reliability in the electronics manufacturing phase:
Jowett, Charles
Microelectronics Reliability. 15 (1976) 6 - p. 595-600 , 1976
Link:
https://doi.org/10.1016/0026-2714(76)90277-8
RT Journal T1 <Title>Reliability in the electronics manufacturing phase</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(76)90277-8&Exemplar=1&LAN=DE A1 Jowett, Charles PB Elsevier BV YR 1976 SN 0026-2714 JF Microelectronics Reliability VO 15 IS 6 SP 595 OP 600 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(76)90277-8 DO https://doi.org/10.1016/0026-2714(76)90277-8 SF ELIB - SuUB Bremen
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