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Guest editorial:
Jowett, Charles E.
Microelectronics Reliability. 26 (1986) 3 - p. 415 , 1986
Link:
https://doi.org/10.1016/0026-2714(86)90284-2
RT Journal T1 <Title>Guest editorial</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(86)90284-2&Exemplar=1&LAN=DE A1 Jowett, Charles E. PB Elsevier BV YR 1986 SN 0026-2714 JF Microelectronics Reliability VO 26 IS 3 SP 415 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(86)90284-2 DO https://doi.org/10.1016/0026-2714(86)90284-2 SF ELIB - SuUB Bremen
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