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4847810 Memory having redundancy circuit:
Tagami, Tomoyuki
Microelectronics Reliability. 30 (1990) 3 - p. ii , 1990
Link:
https://doi.org/10.1016/0026-2714(90)90545-x
RT Journal T1 <Title>4847810 Memory having redundancy circuit</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(90)90545-x&Exemplar=1&LAN=DE A1 Tagami, Tomoyuki PB Elsevier BV YR 1990 SN 0026-2714 JF Microelectronics Reliability VO 30 IS 3 SP ii LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(90)90545-x DO https://doi.org/10.1016/0026-2714(90)90545-x SF ELIB - SuUB Bremen
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