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1 Ergebnisse
1
Bayesian analysis of system availability:
Sharma, K.K.
;
Bhutani, R.K.
Microelectronics Reliability. 33 (1993) 6 - p. 809-811 , 1993
Link:
https://doi.org/10.1016/0026-2714(93)90254-v
RT Journal T1 <Title>Bayesian analysis of system availability</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0026-2714(93)90254-v&Exemplar=1&LAN=DE A1 Sharma, K.K. A1 Bhutani, R.K. PB Elsevier BV YR 1993 SN 0026-2714 JF Microelectronics Reliability VO 33 IS 6 SP 809 OP 811 LK http://dx.doi.org/https://doi.org/10.1016/0026-2714(93)90254-v DO https://doi.org/10.1016/0026-2714(93)90254-v SF ELIB - SuUB Bremen
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