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Emitter-base breakdown: Measurement and simulation:
Bergner, W.
;
Packan, P.
;
Seidl, B.
.
Microelectronic Engineering. 19 (1992) 1-4 - p. 695-698 , 1992
Link:
https://doi.org/10.1016/0167-9317(92)90524-u
RT Journal T1 <Title>Emitter-base breakdown: Measurement and simulation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0167-9317(92)90524-u&Exemplar=1&LAN=DE A1 Bergner, W. A1 Packan, P. A1 Seidl, B. A1 Klose, H. PB Elsevier BV YR 1992 SN 0167-9317 JF Microelectronic Engineering VO 19 IS 1-4 SP 695 OP 698 LK http://dx.doi.org/https://doi.org/10.1016/0167-9317(92)90524-u DO https://doi.org/10.1016/0167-9317(92)90524-u SF ELIB - SuUB Bremen
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