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Coincidence counting analysis of secondary ions emitted fro..:

Ray, K.B. ; da Silveira, E.F. ; Jeronymo, J.M.F....
International Journal of Mass Spectrometry and Ion Processes.  136 (1994)  2-3 - p. 107-117 , 1994
Link: https://doi.org/10.1016/0168-1176(94)04045-1