I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Improved characterization of fully-depleted SOI wafers by p..:

Ionescu, A.M. ; Cristoloveanu, S. ; Wilson, S.R....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  112 (1996)  1-4 - p. 228-232 , 1996
Link: https://doi.org/10.1016/0168-583x(95)01279-6