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X-ray photoelectron spectroscopy of dielectric films of CeO..:
Al-Dhhan, Z.T.
;
Hashemi, T.
;
Hogarth, C.A.
Spectrochimica Acta Part B: Atomic Spectroscopy. 44 (1989) 2 - p. 205-208 , 1989
Link:
https://doi.org/10.1016/0584-8547(89)80022-9
RT Journal T1 <Title>X-ray photoelectron spectroscopy of dielectric films of CeO2, CeO2/Cd, and CeO2/SiO prepared by thermal evaporation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0584-8547(89)80022-9&Exemplar=1&LAN=DE A1 Al-Dhhan, Z.T. A1 Hashemi, T. A1 Hogarth, C.A. PB Elsevier BV YR 1989 SN 0584-8547 JF Spectrochimica Acta Part B: Atomic Spectroscopy VO 44 IS 2 SP 205 OP 208 LK http://dx.doi.org/https://doi.org/10.1016/0584-8547(89)80022-9 DO https://doi.org/10.1016/0584-8547(89)80022-9 SF ELIB - SuUB Bremen
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