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Microfocus X-ray spectra measurement:
RHEINLANDER, J
Journal of X-Ray Science and Technology. 3 (1992) 3 - p. 166-175 , 1992
Link:
https://doi.org/10.1016/0895-3996(92)90008-8
RT Journal T1 <Title>Microfocus X-ray spectra measurement</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_0895-3996(92)90008-8&Exemplar=1&LAN=DE A1 RHEINLANDER, J PB Elsevier BV YR 1992 SN 0895-3996 JF Journal of X-Ray Science and Technology VO 3 IS 3 SP 166 OP 175 LK http://dx.doi.org/https://doi.org/10.1016/0895-3996(92)90008-8 DO https://doi.org/10.1016/0895-3996(92)90008-8 SF ELIB - SuUB Bremen
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