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Electron irradiation effects on power MOS transistors:

Frisina, F. ; Gombia, E. ; Chirco, P....
International Journal of Radiation Applications and Instrumentation. Part C. Radiation Physics and Chemistry.  35 (1990)  4-6 - p. 500-506 , 1990
Link: https://doi.org/10.1016/1359-0197(90)90259-k