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, In: Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices,

Balke, Nina ; Batra, Rohit ; Böttger, Ulrich... - p. xiii-xv , 2019

Link: https://doi.org/10.1016/b978-0-08-102430-0.09991-5

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T1 <cTitle>Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices</cTitle>: T1 <Title>Contributors</Title>

UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_b978-0-08-102430-0.09991-5&Exemplar=1&LAN=DE
				
A1 Balke, Nina
A1 Batra, Rohit
A1 Böttger, Ulrich
A1 Breyer, Evelyn T.
A1 Do Kim, Keum
A1 Fancher, Chris M.
A1 Fengler, Franz
A1 Fujii, Shosuke
A1 Funakubo, Hiroshi
A1 Griesche, David
A1 Grimley, Everett D.
A1 Gruverman, Alexei
A1 Hoffmann, Michael
A1 Hwang, Cheol Seong
A1 Hyun, Seung Dam
A1 Ihlefeld, Jon F.
A1 Johnson, Brienne
A1 Jones, Jacob L.
A1 Kersch, Alfred
A1 Kim, Han Joon
A1 Künneth, Christopher
A1 Larcher, Luca
A1 LeBeau, James M.
A1 Lee, Young Hwan
A1 Migita, Shinji
A1 Mikolajick, Thomas
A1 Mueller, Johannes
A1 Mulaosmanovic, Halid
A1 Park, Min Hyuk
A1 Pešić, Milan
A1 Ramprasad, Rampi
A1 Rossetti, George A.
A1 Saitoh, Masumi
A1 Schenk, Tony
A1 Schneller, Theodor
A1 Schroeder, Uwe
A1 Shibayama, Shigehisa
A1 Shimizu, Takao
A1 Slesazeck, Stefan
A1 Starschich, Sergej
A1 Stolichnov, Igor
A1 Tian, Xuan
A1 Toriumi, Akira
A1 Xu, Lun
PB Elsevier
YR 2019
SP xiii
OP xv
LK http://dx.doi.org/https://doi.org/10.1016/b978-0-08-102430-0.09991-5
DO https://doi.org/10.1016/b978-0-08-102430-0.09991-5
SF ELIB - SuUB Bremen

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