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1 Ergebnisse
1
Grown-in defects and thermal instability affecting the reli..:
, In:
Reliability of Semiconductor Lasers and Optoelectronic Devices
,
Ueda, Osamu
;
Tomiya, Shigetaka
- p. 177-238 , 2021
Link:
https://doi.org/10.1016/b978-0-12-819254-2.00004-7
RT T1 <cTitle>Reliability of Semiconductor Lasers and Optoelectronic Devices</cTitle>: T1 <Title>Grown-in defects and thermal instability affecting the reliability of lasers: III–Vs versus III-nitrides</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_b978-0-12-819254-2.00004-7&Exemplar=1&LAN=DE A1 Ueda, Osamu A1 Tomiya, Shigetaka PB Elsevier YR 2021 SP 177 OP 238 LK http://dx.doi.org/https://doi.org/10.1016/b978-0-12-819254-2.00004-7 DO https://doi.org/10.1016/b978-0-12-819254-2.00004-7 SF ELIB - SuUB Bremen
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