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1 Ergebnisse
1
MEMS Testing:
, In:
System-on-Chip Test Architectures
,
Ramadoss, Ramesh
;
Dean, Robert
;
Xiong, Xingguo
- p. 591-651 , 2008
Link:
https://doi.org/10.1016/b978-012373973-5.50018-8
RT T1 <cTitle>System-on-Chip Test Architectures</cTitle>: T1 <Title>MEMS Testing</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_b978-012373973-5.50018-8&Exemplar=1&LAN=DE A1 Ramadoss, Ramesh A1 Dean, Robert A1 Xiong, Xingguo PB Elsevier YR 2008 SP 591 OP 651 LK http://dx.doi.org/https://doi.org/10.1016/b978-012373973-5.50018-8 DO https://doi.org/10.1016/b978-012373973-5.50018-8 SF ELIB - SuUB Bremen
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