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List of Authors:
, In:
Advanced Laser Diode Reliability
,
Béchou, Laurent
;
Cassidy, Daniel T.
;
Danto, Yves
... - p. 255-256 , 2021
Link:
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
RT T1
Advanced Laser Diode Reliability
: T1
List of Authors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_b978-1-78548-154-3.50011-2&Exemplar=1&LAN=DE A1 Béchou, Laurent A1 Cassidy, Daniel T. A1 Danto, Yves A1 Deshayes, Yannick A1 Fukuda, Mitsuo A1 Lam, Samuel K.K. A1 Marcello, Giulia A1 Mendizabal, Laurent A1 Mura, Giovanna A1 Ousten, Yves A1 Valle, Valerio Sanna A1 Vanzi, Massimo A1 Verdier, Frédéric PB Elsevier YR 2021 SP 255 OP 256 LK http://dx.doi.org/https://doi.org/10.1016/b978-1-78548-154-3.50011-2 DO https://doi.org/10.1016/b978-1-78548-154-3.50011-2 SF ELIB - SuUB Bremen
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