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Development of a spatial dimension-based taxonomy for class..:
Choi, Seung-Hyun
;
Lee, Dong-Hee
;
Kim, Eun-Su
...
Advanced Engineering Informatics. 60 (2024) - p. 102540 , 2024
Link:
https://doi.org/10.1016/j.aei.2024.102540
RT Journal T1
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.aei.2024.102540&Exemplar=1&LAN=DE A1 Choi, Seung-Hyun A1 Lee, Dong-Hee A1 Kim, Eun-Su A1 Bae, Young-Mok A1 Oh, Young-Chan A1 Kim, Kwang-Jae PB Elsevier BV YR 2024 SN 1474-0346 JF Advanced Engineering Informatics VO 60 SP 102540 LK http://dx.doi.org/https://doi.org/10.1016/j.aei.2024.102540 DO https://doi.org/10.1016/j.aei.2024.102540 SF ELIB - SuUB Bremen
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