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Assessing advanced methods in XPS and HAXPES for determinin..:
Bure, T.R.
;
Renault, O.
;
Nolot, E.
...
Applied Surface Science. 609 (2023) - p. 155317 , 2023
Link:
https://doi.org/10.1016/j.apsusc.2022.155317
RT Journal T1
Assessing advanced methods in XPS and HAXPES for determining the thicknesses of high-k oxide materials: From ultra-thin layers to deeply buried interfaces
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.apsusc.2022.155317&Exemplar=1&LAN=DE A1 Bure, T.R. A1 Renault, O. A1 Nolot, E. A1 Lardin, T. A1 Robert-Goumet, C. A1 Pauly, N. PB Elsevier BV YR 2023 SN 0169-4332 JF Applied Surface Science VO 609 SP 155317 LK http://dx.doi.org/https://doi.org/10.1016/j.apsusc.2022.155317 DO https://doi.org/10.1016/j.apsusc.2022.155317 SF ELIB - SuUB Bremen
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