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1 Ergebnisse
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A deep residual neural network for semiconductor defect cla..:
López de la Rosa, Francisco
;
Gómez-Sirvent, José L.
;
Morales, Rafael
..
Applied Soft Computing. 131 (2022) - p. 109743 , 2022
Link:
https://doi.org/10.1016/j.asoc.2022.109743
RT Journal T1
A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.asoc.2022.109743&Exemplar=1&LAN=DE A1 López de la Rosa, Francisco A1 Gómez-Sirvent, José L. A1 Morales, Rafael A1 Sánchez-Reolid, Roberto A1 Fernández-Caballero, Antonio PB Elsevier BV YR 2022 SN 1568-4946 JF Applied Soft Computing VO 131 SP 109743 LK http://dx.doi.org/https://doi.org/10.1016/j.asoc.2022.109743 DO https://doi.org/10.1016/j.asoc.2022.109743 SF ELIB - SuUB Bremen
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