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Power divergence approach for one-shot device testing under..:
Balakrishnan, N.
;
Castilla, E.
;
Martin, N.
.
Journal of Computational and Applied Mathematics. 419 (2023) - p. 114676 , 2023
Link:
https://doi.org/10.1016/j.cam.2022.114676
RT Journal T1 <Title>Power divergence approach for one-shot device testing under competing risks</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.cam.2022.114676&Exemplar=1&LAN=DE A1 Balakrishnan, N. A1 Castilla, E. A1 Martin, N. A1 Pardo, L. PB Elsevier BV YR 2023 SN 0377-0427 JF Journal of Computational and Applied Mathematics VO 419 SP 114676 LK http://dx.doi.org/https://doi.org/10.1016/j.cam.2022.114676 DO https://doi.org/10.1016/j.cam.2022.114676 SF ELIB - SuUB Bremen
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