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1 Ergebnisse
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Polymer tips for application of atomic force microscopy:
Kim, Woo-Sik
;
Park, Kang-Min
;
Park, Jung Jin
...
Current Applied Physics. 7 (2007) 5 - p. 528-531 , 2007
Link:
https://doi.org/10.1016/j.cap.2006.10.010
RT Journal T1
Polymer tips for application of atomic force microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.cap.2006.10.010&Exemplar=1&LAN=DE A1 Kim, Woo-Sik A1 Park, Kang-Min A1 Park, Jung Jin A1 Chang, Sang-Mok A1 Kim, In-Ho A1 Muramatsu, Hiroshi A1 Kim, Jong Min PB Elsevier BV YR 2007 SN 1567-1739 JF Current Applied Physics VO 7 IS 5 SP 528 OP 531 LK http://dx.doi.org/https://doi.org/10.1016/j.cap.2006.10.010 DO https://doi.org/10.1016/j.cap.2006.10.010 SF ELIB - SuUB Bremen
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