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Simultaneous process mean and variance monitoring using art..:
Guh, Ruey-Shiang
Computers & Industrial Engineering. 58 (2010) 4 - p. 739-753 , 2010
Link:
https://doi.org/10.1016/j.cie.2010.02.004
RT Journal T1 <Title>Simultaneous process mean and variance monitoring using artificial neural networks</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.cie.2010.02.004&Exemplar=1&LAN=DE A1 Guh, Ruey-Shiang PB Elsevier BV YR 2010 SN 0360-8352 JF Computers & Industrial Engineering VO 58 IS 4 SP 739 OP 753 LK http://dx.doi.org/https://doi.org/10.1016/j.cie.2010.02.004 DO https://doi.org/10.1016/j.cie.2010.02.004 SF ELIB - SuUB Bremen
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