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1 Ergebnisse
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Multi defect detection and analysis of electron microscopy ..:
Shen, Mingren
;
Li, Guanzhao
;
Wu, Dongxia
...
Computational Materials Science. 199 (2021) - p. 110576 , 2021
Link:
https://doi.org/10.1016/j.commatsci.2021.110576
RT Journal T1
Multi defect detection and analysis of electron microscopy images with deep learning
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.commatsci.2021.110576&Exemplar=1&LAN=DE A1 Shen, Mingren A1 Li, Guanzhao A1 Wu, Dongxia A1 Liu, Yuhan A1 Greaves, Jacob R.C. A1 Hao, Wei A1 Krakauer, Nathaniel J. A1 Krudy, Leah A1 Perez, Jacob A1 Sreenivasan, Varun A1 Sanchez, Bryan A1 Torres-Velázquez, Oigimer A1 Li, Wei A1 Field, Kevin G. A1 Morgan, Dane PB Elsevier BV YR 2021 SN 0927-0256 JF Computational Materials Science VO 199 SP 110576 LK http://dx.doi.org/https://doi.org/10.1016/j.commatsci.2021.110576 DO https://doi.org/10.1016/j.commatsci.2021.110576 SF ELIB - SuUB Bremen
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