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1 Ergebnisse
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Coupled electronic and atomic effects on defect evolution i..:
Zhang, Yanwen
;
Xue, Haizhou
;
Zarkadoula, Eva
...
Current Opinion in Solid State and Materials Science. 21 (2017) 6 - p. 285-298 , 2017
Link:
https://doi.org/10.1016/j.cossms.2017.09.003
RT Journal T1
Coupled electronic and atomic effects on defect evolution in silicon carbide under ion irradiation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.cossms.2017.09.003&Exemplar=1&LAN=DE A1 Zhang, Yanwen A1 Xue, Haizhou A1 Zarkadoula, Eva A1 Sachan, Ritesh A1 Ostrouchov, Christopher A1 Liu, Peng A1 Wang, Xue-lin A1 Zhang, Shuo A1 Wang, Tie Shan A1 Weber, William J. PB Elsevier BV YR 2017 SN 1359-0286 JF Current Opinion in Solid State and Materials Science VO 21 IS 6 SP 285 OP 298 LK http://dx.doi.org/https://doi.org/10.1016/j.cossms.2017.09.003 DO https://doi.org/10.1016/j.cossms.2017.09.003 SF ELIB - SuUB Bremen
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