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1 Ergebnisse
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Wafer-thickness Dependence of Double-side Contacted Rear Ju..:
Ballmann, Tabitha
;
Mertens, Verena
;
Peters, Christina
...
Energy Procedia. 55 (2014) - p. 396-399 , 2014
Link:
https://doi.org/10.1016/j.egypro.2014.08.113
RT Journal T1
Wafer-thickness Dependence of Double-side Contacted Rear Junction n-type Solar Cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.egypro.2014.08.113&Exemplar=1&LAN=DE A1 Ballmann, Tabitha A1 Mertens, Verena A1 Peters, Christina A1 Koentopp, Max A1 Cieslak, Janko A1 Schönmann, Antje A1 Christian Klenke A1 Kauert, Maximilian A1 Zimmermann, Gregor A1 Bordihn, Stefan A1 Müller, Jörg W. PB Elsevier BV YR 2014 SN 1876-6102 JF Energy Procedia VO 55 SP 396 OP 399 LK http://dx.doi.org/https://doi.org/10.1016/j.egypro.2014.08.113 DO https://doi.org/10.1016/j.egypro.2014.08.113 SF ELIB - SuUB Bremen
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