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An optimal defect recognition security-based terahertz low ..:
Danso, Samuel Akwasi
;
Liping, Shang
;
Hu, Deng
...
Egyptian Informatics Journal. 24 (2023) 3 - p. 100384 , 2023
Link:
https://doi.org/10.1016/j.eij.2023.05.009
RT Journal T1
An optimal defect recognition security-based terahertz low resolution image system using deep learning network
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.eij.2023.05.009&Exemplar=1&LAN=DE A1 Danso, Samuel Akwasi A1 Liping, Shang A1 Hu, Deng A1 Afoakwa, Samuel A1 Badzongoly, Eugene Louis A1 Odoom, Justice A1 Muhammad, Owais A1 Mushtaq, Muhammad Umer A1 Qayoom, Abdul A1 Zhou, Wenqing PB Elsevier BV YR 2023 SN 1110-8665 JF Egyptian Informatics Journal VO 24 IS 3 SP 100384 LK http://dx.doi.org/https://doi.org/10.1016/j.eij.2023.05.009 DO https://doi.org/10.1016/j.eij.2023.05.009 SF ELIB - SuUB Bremen
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