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Hole-concentration dependence of electrical resistivity in ..:
Kondo, Takeshi
;
Takeuchi, Tsunehiro
;
Yokoya, Takayoshi
...
Journal of Electron Spectroscopy and Related Phenomena. 144-147 (2005) - p. 1249-1252 , 2005
Link:
https://doi.org/10.1016/j.elspec.2005.01.198
RT Journal T1 <Title>Hole-concentration dependence of electrical resistivity in the (Bi, Pb)2(Sr, La)2CuO6+δ quantitative evaluation with angle-resolved photoemission spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.elspec.2005.01.198&Exemplar=1&LAN=DE A1 Kondo, Takeshi A1 Takeuchi, Tsunehiro A1 Yokoya, Takayoshi A1 Tsuda, Syunsuke A1 Shin, Shik A1 Mizutani, Uichiro PB Elsevier BV YR 2005 SN 0368-2048 JF Journal of Electron Spectroscopy and Related Phenomena VO 144-147 SP 1249 OP 1252 LK http://dx.doi.org/https://doi.org/10.1016/j.elspec.2005.01.198 DO https://doi.org/10.1016/j.elspec.2005.01.198 SF ELIB - SuUB Bremen
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