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Limitations of Near Edge X-ray Absorption Fine Structure as..:
Johnson, Benjamin
;
Klaer, Jo
;
Merdes, Saoussen
...
Journal of Electron Spectroscopy and Related Phenomena. 190 (2013) - p. 42-46 , 2013
Link:
https://doi.org/10.1016/j.elspec.2013.01.007
RT Journal T1 <Title>Limitations of Near Edge X-ray Absorption Fine Structure as a tool for observing conduction bands in chalcopyrite solar cell heterojunctions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.elspec.2013.01.007&Exemplar=1&LAN=DE A1 Johnson, Benjamin A1 Klaer, Jo A1 Merdes, Saoussen A1 Gorgoi, Mihaela A1 Höpfner, Britta A1 Vollmer, Antje A1 Lauermann, Iver PB Elsevier BV YR 2013 SN 0368-2048 JF Journal of Electron Spectroscopy and Related Phenomena VO 190 SP 42 OP 46 LK http://dx.doi.org/https://doi.org/10.1016/j.elspec.2013.01.007 DO https://doi.org/10.1016/j.elspec.2013.01.007 SF ELIB - SuUB Bremen
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