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Characterization of the primary X-ray source of an XPS micr..:
Scheithauer, U.
Journal of Electron Spectroscopy and Related Phenomena. 193 (2014) - p. 58-62 , 2014
Link:
https://doi.org/10.1016/j.elspec.2014.03.009
RT Journal T1 <Title>Characterization of the primary X-ray source of an XPS microprobe Quantum 2000</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.elspec.2014.03.009&Exemplar=1&LAN=DE A1 Scheithauer, U. PB Elsevier BV YR 2014 SN 0368-2048 JF Journal of Electron Spectroscopy and Related Phenomena VO 193 SP 58 OP 62 LK http://dx.doi.org/https://doi.org/10.1016/j.elspec.2014.03.009 DO https://doi.org/10.1016/j.elspec.2014.03.009 SF ELIB - SuUB Bremen
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