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1 Ergebnisse
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Effect of argon sputtering on XPS depth-profiling results o..:
Demchenko, Iraida N.
;
Melikhov, Yevgen
;
Syryanyy, Yevgen
...
Journal of Electron Spectroscopy and Related Phenomena. 224 (2018) - p. 17-22 , 2018
Link:
https://doi.org/10.1016/j.elspec.2017.09.009
RT Journal T1 <Title>Effect of argon sputtering on XPS depth-profiling results of Si/Nb/Si</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.elspec.2017.09.009&Exemplar=1&LAN=DE A1 Demchenko, Iraida N. A1 Melikhov, Yevgen A1 Syryanyy, Yevgen A1 Zaytseva, Irina A1 Konstantynov, Pavlo A1 Chernyshova, Maryna PB Elsevier BV YR 2018 SN 0368-2048 JF Journal of Electron Spectroscopy and Related Phenomena VO 224 SP 17 OP 22 LK http://dx.doi.org/https://doi.org/10.1016/j.elspec.2017.09.009 DO https://doi.org/10.1016/j.elspec.2017.09.009 SF ELIB - SuUB Bremen
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