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Supervised contrastive learning for wafer map pattern class..:
Bae, Youngjae
;
Kang, Seokho
Engineering Applications of Artificial Intelligence. 126 (2023) - p. 107154 , 2023
Link:
https://doi.org/10.1016/j.engappai.2023.107154
RT Journal T1 <Title>Supervised contrastive learning for wafer map pattern classification</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.engappai.2023.107154&Exemplar=1&LAN=DE A1 Bae, Youngjae A1 Kang, Seokho PB Elsevier BV YR 2023 SN 0952-1976 JF Engineering Applications of Artificial Intelligence VO 126 SP 107154 LK http://dx.doi.org/https://doi.org/10.1016/j.engappai.2023.107154 DO https://doi.org/10.1016/j.engappai.2023.107154 SF ELIB - SuUB Bremen
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