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1 Ergebnisse
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Temperature and flaw size-dependent electrical breakdown st..:
Gu, Mingyu
;
Cai, Hongwei
;
Li, Weiguo
..
Journal of Energy Storage. 83 (2024) - p. 110681 , 2024
Link:
https://doi.org/10.1016/j.est.2024.110681
RT Journal T1 <Title>Temperature and flaw size-dependent electrical breakdown strength of high-temperature polymer dielectric materials</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.est.2024.110681&Exemplar=1&LAN=DE A1 Gu, Mingyu A1 Cai, Hongwei A1 Li, Weiguo A1 Wan, Yu A1 Wang, Ruzhuan PB Elsevier BV YR 2024 SN 2352-152X JF Journal of Energy Storage VO 83 SP 110681 LK http://dx.doi.org/https://doi.org/10.1016/j.est.2024.110681 DO https://doi.org/10.1016/j.est.2024.110681 SF ELIB - SuUB Bremen
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