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A Bayesian network-based approach for fault analysis:
Jun, Hong-Bae
;
Kim, David
Expert Systems with Applications. 81 (2017) - p. 332-348 , 2017
Link:
https://doi.org/10.1016/j.eswa.2017.03.056
RT Journal T1 <Title>A Bayesian network-based approach for fault analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.eswa.2017.03.056&Exemplar=1&LAN=DE A1 Jun, Hong-Bae A1 Kim, David PB Elsevier BV YR 2017 SN 0957-4174 JF Expert Systems with Applications VO 81 SP 332 OP 348 LK http://dx.doi.org/https://doi.org/10.1016/j.eswa.2017.03.056 DO https://doi.org/10.1016/j.eswa.2017.03.056 SF ELIB - SuUB Bremen
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