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Forensic analysis of note and journal applications:
Shin, Sumin
;
Kim, Giyoon
;
Kim, Soram
.
Forensic Science International: Digital Investigation. 40 (2022) - p. 301355 , 2022
Link:
https://doi.org/10.1016/j.fsidi.2022.301355
RT Journal T1 <Title>Forensic analysis of note and journal applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.fsidi.2022.301355&Exemplar=1&LAN=DE A1 Shin, Sumin A1 Kim, Giyoon A1 Kim, Soram A1 Kim, Jongsung PB Elsevier BV YR 2022 SN 2666-2817 JF Forensic Science International: Digital Investigation VO 40 SP 301355 LK http://dx.doi.org/https://doi.org/10.1016/j.fsidi.2022.301355 DO https://doi.org/10.1016/j.fsidi.2022.301355 SF ELIB - SuUB Bremen
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